IEEE International Workshop on Design and Test of Defect-Tolerant Nanoscale Architectures (NANOARCH’05)

To be held in conjunction with the VLSI Test Symposium
May 1, 2005

The Lodge at Rancho Mirage, Palm Springs, CA, USA

Advance Program
Off-line manufacturing testing, defect tolerance and fault-tolerance techniques are designed under the assumption that the system under test is composed largely of correctly functioning units. This assumption is severely tested in the case of emerging nanotechnologies such as molecular electronics, quantum electronics, single electron transistors and carbon nanotubes and nanowires. Self-assembly based device, circuit and system level integration results in failures rates that are orders of magnitude higher than traditional CMOS designs. In these emerging technologies, fault and defect tolerance architectures -at the physical, circuit and most importantly at the system level- are hence an enabling technology for building reliable systems. The NANOARCH workshop will investigate novel defect and fault tolerance architectures suitable for highly unreliable nanotechnologies. The workshop will be a forum for presenting theoretical, simulation and case studies on new defect models, defect and fault tolerance architectures, reliability models and experimental reliability evaluation and validation frameworks related to defect and fault tolerant nanoscale architectures and computer aided simulation and design tools for these emerging nanotechnologies. Topics of interest include but are not limited to:
  • Failure modes in emerging nanoscale device technologies including molecular electronics, quantum electronics, single electron transistors, carbon nanotubes and carbon nanowires
  • Defect and fault models for emerging nanoscale device technologies
  • Circuit, Logic and System level Testing methodologies for Nanoscale Architectures
  • Yield models, yield analysis and yield enhancement in nanoscale technologies.
  • Device, Circuit, and System level Defect Tolerant Nanoscale Architectures
  • Device, Circuit, and System level Fault Tolerant Nanoscale Architectures
  • Emerging computational models for Nanotechnologies that consider reliability
  • Novel Nanoscale Architectures that consider testing and reliability
  • Dynamic reconfiguration in nanoscale architectures
  • CAD for defect and fault-tolerant nanoscale systems
The Program Committee invites authors to submit papers up to 8 pages in length, describing original, unpublished recent work. Clearly describe the nature of the work, explain its significance, highlight novel features, and describe its current status. Electronic submission through the workshop website is required. The submission of a paper proposal will be considered evidence that upon acceptance, the author(s) will present their paper at the workshop. Final versions of accepted papers will be included in the NANOARCH Workshop Digest.
Important deadlines:
Abstracts due: February 4, 2005Papers due: February 11, 2005
Acceptance notification: March 20, 2005Final version due: April 8, 2005
Sponsored by the IEEE Computer Society, Test Technology Technical Council.